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Annealing effects on the microstructure of sputtered gold layers on oxidized silicon investigated by scanning electron microscopy and scanning probe microscopy

J. L. Plaza, S. Jacke, Y. Chen, R. E. Palmer, Richard Palmer Orcid Logo

Philosophical Magazine, Volume: 83, Issue: 9, Pages: 1137 - 1142

Swansea University Author: Richard Palmer Orcid Logo

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Published in: Philosophical Magazine
ISSN: 1478-6435 1478-6443
Published: 2003
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College: Faculty of Science and Engineering
Issue: 9
Start Page: 1137
End Page: 1142