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Annealing effects on the microstructure of sputtered gold layers on oxidized silicon investigated by scanning electron microscopy and scanning probe microscopy

J. L. Plaza, S. Jacke, Y. Chen, R. E. Palmer, Richard Palmer Orcid Logo

Philosophical Magazine, Volume: 83, Issue: 9, Pages: 1137 - 1142

Swansea University Author: Richard Palmer Orcid Logo

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DOI (Published version): 10.1080/0141861031000072006

Published in: Philosophical Magazine
ISSN: 1478-6435 1478-6443
Published: 2003
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URI: https://cronfa.swan.ac.uk/Record/cronfa49391
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spelling 2019-03-18T14:34:22.6803628 v2 49391 2019-03-18 Annealing effects on the microstructure of sputtered gold layers on oxidized silicon investigated by scanning electron microscopy and scanning probe microscopy 6ae369618efc7424d9774377536ea519 0000-0001-8728-8083 Richard Palmer Richard Palmer true false 2019-03-18 ACEM Journal Article Philosophical Magazine 83 9 1137 1142 1478-6435 1478-6443 31 12 2003 2003-12-31 10.1080/0141861031000072006 COLLEGE NANME Aerospace, Civil, Electrical, and Mechanical Engineering COLLEGE CODE ACEM Swansea University 2019-03-18T14:34:22.6803628 2019-03-18T14:34:22.4511952 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Mechanical Engineering J. L. Plaza 1 S. Jacke 2 Y. Chen 3 R. E. Palmer 4 Richard Palmer 0000-0001-8728-8083 5
title Annealing effects on the microstructure of sputtered gold layers on oxidized silicon investigated by scanning electron microscopy and scanning probe microscopy
spellingShingle Annealing effects on the microstructure of sputtered gold layers on oxidized silicon investigated by scanning electron microscopy and scanning probe microscopy
Richard Palmer
title_short Annealing effects on the microstructure of sputtered gold layers on oxidized silicon investigated by scanning electron microscopy and scanning probe microscopy
title_full Annealing effects on the microstructure of sputtered gold layers on oxidized silicon investigated by scanning electron microscopy and scanning probe microscopy
title_fullStr Annealing effects on the microstructure of sputtered gold layers on oxidized silicon investigated by scanning electron microscopy and scanning probe microscopy
title_full_unstemmed Annealing effects on the microstructure of sputtered gold layers on oxidized silicon investigated by scanning electron microscopy and scanning probe microscopy
title_sort Annealing effects on the microstructure of sputtered gold layers on oxidized silicon investigated by scanning electron microscopy and scanning probe microscopy
author_id_str_mv 6ae369618efc7424d9774377536ea519
author_id_fullname_str_mv 6ae369618efc7424d9774377536ea519_***_Richard Palmer
author Richard Palmer
author2 J. L. Plaza
S. Jacke
Y. Chen
R. E. Palmer
Richard Palmer
format Journal article
container_title Philosophical Magazine
container_volume 83
container_issue 9
container_start_page 1137
publishDate 2003
institution Swansea University
issn 1478-6435
1478-6443
doi_str_mv 10.1080/0141861031000072006
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Mechanical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Mechanical Engineering
document_store_str 0
active_str 0
published_date 2003-12-31T19:53:16Z
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score 11.048302

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