Journal article 436 views
Nano-Scale Movement Induced In Graphene Ripples by Multi-Probe Microscopy
International Journal of Advanced Research in Engineering, Volume: 3, Issue: 2, Start page: 22
Swansea University Authors:
Christopher Barnett, Richard Cobley
Full text not available from this repository: check for access using links below.
DOI (Published version): 10.24178/ijare.2017.3.2.22
Abstract
An Omicron low temperature multi-probe technique is used for manipulation of mechanically exfoliated suspended and attached graphene sheets on SiO2 substrates. Scanning electron microscopy (SEM) and Raman spectroscopy are used to detect the graphene sheets and determine their thicknesses and quality...
| Published in: | International Journal of Advanced Research in Engineering |
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| ISSN: | 2412-4362 |
| Published: |
Research Plus Journals
2017
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| Online Access: |
Check full text
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa52761 |
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| Abstract: |
An Omicron low temperature multi-probe technique is used for manipulation of mechanically exfoliated suspended and attached graphene sheets on SiO2 substrates. Scanning electron microscopy (SEM) and Raman spectroscopy are used to detect the graphene sheets and determine their thicknesses and quality, respectively. The interaction of the etched tungsten tip with the graphene is used to lift and release the sheet and induce artificial ripples. Both suspended and attached sheets onto the substrates show different behaviour in response to bias voltage. |
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| College: |
Professional Services |
| Issue: |
2 |
| Start Page: |
22 |