Journal article 332 views
NEGF simulations of the effect of strain on scaled double gate nanoMOSFETs / Karol Kalna
Journal of Computational Electronics
Swansea University Author: Kalna, Karol
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DOI (Published version): 10.1007/s10825-008-0212-8
NEGF simulations of the effect of strain on scaled double gate nanoMOSFETs
|Published in:||Journal of Computational Electronics|
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