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NEGF simulations of the effect of strain on scaled double gate nanoMOSFETs / Karol, Kalna; Antonio, Martinez Muniz

Journal of Computational Electronics

Swansesa University Authors: Karol, Kalna, Antonio, Martinez Muniz

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DOI (Published version): 10.1007/s10825-008-0212-8

Published in: Journal of Computational Electronics
Published: 2008
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College: College of Engineering