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NEGF simulations of the effect of strain on scaled double gate nanoMOSFETs

Karol Kalna Orcid Logo, Antonio Martinez Muniz Orcid Logo

Journal of Computational Electronics

Swansea University Authors: Karol Kalna Orcid Logo, Antonio Martinez Muniz Orcid Logo

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DOI (Published version): 10.1007/s10825-008-0212-8

Published in: Journal of Computational Electronics
Published: 2008
URI: https://cronfa.swan.ac.uk/Record/cronfa6059
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College: College of Engineering