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Automatic epileptic seizure detection in EEGs based on optimized sample entropy and extreme learning machine

Yuedong Song, Jon Crowcroft, Jiaxiang Zhang Orcid Logo

Journal of Neuroscience Methods, Volume: 210, Issue: 2, Pages: 132 - 146

Swansea University Author: Jiaxiang Zhang Orcid Logo

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Published in: Journal of Neuroscience Methods
ISSN: 0165-0270
Published: Elsevier BV 2012
Online Access: Check full text

URI: https://cronfa.swan.ac.uk/Record/cronfa61337
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Keywords: Epileptic seizure detection; Electroencephalogram (EEG); Optimized sample entropy (O-SampEn); Extreme learning machine (ELM)
College: Faculty of Science and Engineering
Issue: 2
Start Page: 132
End Page: 146