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Automatic recognition of epileptic EEG patterns via Extreme Learning Machine and multiresolution feature extraction

Yuedong Song, Jiaxiang Zhang Orcid Logo

Expert Systems with Applications, Volume: 40, Issue: 14, Pages: 5477 - 5489

Swansea University Author: Jiaxiang Zhang Orcid Logo

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Published in: Expert Systems with Applications
ISSN: 0957-4174
Published: Elsevier BV 2013
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Keywords: Epilepsy diagnosis; Electroencephalogram (EEG); Multiresolution analysis; Feature extraction; Genetic algorithm (GA); Extreme Learning Machine (ELM)
College: Faculty of Science and Engineering
Issue: 14
Start Page: 5477
End Page: 5489