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Annealing Effects of Ti/Au Contact on n-MgZnO/p-Si Ultraviolet-B Photodetectors

Yaonan Hou, Zengxia Mei, Huili Liang, Daqian Ye, Changzhi Gu, Xiaolong Du, Yicheng Lu

IEEE Transactions on Electron Devices, Volume: 60, Issue: 10, Pages: 3474 - 3477

Swansea University Author: Yaonan Hou

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DOI (Published version): 10.1109/ted.2013.2278894

Published in: IEEE Transactions on Electron Devices
ISSN: 0018-9383 1557-9646
Published: Institute of Electrical and Electronics Engineers (IEEE) 2013
Online Access: Check full text

URI: https://cronfa.swan.ac.uk/Record/cronfa65320
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last_indexed 2024-04-10T14:09:22Z
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spelling v2 65320 2023-12-14 Annealing Effects of Ti/Au Contact on n-MgZnO/p-Si Ultraviolet-B Photodetectors 113975f710084997abdb26ad5fa03e8e Yaonan Hou Yaonan Hou true false 2023-12-14 EEEG Journal Article IEEE Transactions on Electron Devices 60 10 3474 3477 Institute of Electrical and Electronics Engineers (IEEE) 0018-9383 1557-9646 1 10 2013 2013-10-01 10.1109/ted.2013.2278894 COLLEGE NANME Electronic and Electrical Engineering COLLEGE CODE EEEG Swansea University 2024-04-10T15:09:25.7326190 2023-12-14T16:45:53.4964529 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering Yaonan Hou 1 Zengxia Mei 2 Huili Liang 3 Daqian Ye 4 Changzhi Gu 5 Xiaolong Du 6 Yicheng Lu 7
title Annealing Effects of Ti/Au Contact on n-MgZnO/p-Si Ultraviolet-B Photodetectors
spellingShingle Annealing Effects of Ti/Au Contact on n-MgZnO/p-Si Ultraviolet-B Photodetectors
Yaonan Hou
title_short Annealing Effects of Ti/Au Contact on n-MgZnO/p-Si Ultraviolet-B Photodetectors
title_full Annealing Effects of Ti/Au Contact on n-MgZnO/p-Si Ultraviolet-B Photodetectors
title_fullStr Annealing Effects of Ti/Au Contact on n-MgZnO/p-Si Ultraviolet-B Photodetectors
title_full_unstemmed Annealing Effects of Ti/Au Contact on n-MgZnO/p-Si Ultraviolet-B Photodetectors
title_sort Annealing Effects of Ti/Au Contact on n-MgZnO/p-Si Ultraviolet-B Photodetectors
author_id_str_mv 113975f710084997abdb26ad5fa03e8e
author_id_fullname_str_mv 113975f710084997abdb26ad5fa03e8e_***_Yaonan Hou
author Yaonan Hou
author2 Yaonan Hou
Zengxia Mei
Huili Liang
Daqian Ye
Changzhi Gu
Xiaolong Du
Yicheng Lu
format Journal article
container_title IEEE Transactions on Electron Devices
container_volume 60
container_issue 10
container_start_page 3474
publishDate 2013
institution Swansea University
issn 0018-9383
1557-9646
doi_str_mv 10.1109/ted.2013.2278894
publisher Institute of Electrical and Electronics Engineers (IEEE)
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering
document_store_str 0
active_str 0
published_date 2013-10-01T15:09:22Z
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score 11.012678

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