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Use of density gradient quantum corrections in the simulation of statistical variability in MOSFETs

Antonio Martinez Muniz, Antonio Martinez Muniz Orcid Logo

Journal of Computational Electronics, Volume: 9, Issue: 3-4

Swansea University Author: Antonio Martinez Muniz Orcid Logo

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DOI (Published version): 10.1007/s10825-010-0314-y

Published in: Journal of Computational Electronics
Published: 2010
URI: https://cronfa.swan.ac.uk/Record/cronfa10567
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College: College of Engineering
Issue: 3-4