Journal article 1181 views
Simulation of statistical variability in nano-CMOS transistors using drift-diffusion, Monte Carlo and non-equilibrium Green’s function techniques
Journal of Computational Electronics, Volume: 8, Issue: 3-4
Swansea University Author: Antonio Martinez Muniz
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DOI (Published version): 10.1007/s10825-009-0292-0
Abstract
Simulation of statistical variability in nano-CMOS transistors using drift-diffusion, Monte Carlo and non-equilibrium Green’s function techniques
Published in: | Journal of Computational Electronics |
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Published: |
2009
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URI: | https://cronfa.swan.ac.uk/Record/cronfa10571 |
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College: |
Faculty of Science and Engineering |
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Issue: |
3-4 |