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Simulation of statistical variability in nano-CMOS transistors using drift-diffusion, Monte Carlo and non-equilibrium Green’s function techniques

Antonio Martinez Muniz, Antonio Martinez Muniz Orcid Logo

Journal of Computational Electronics, Volume: 8, Issue: 3-4

Swansea University Author: Antonio Martinez Muniz Orcid Logo

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DOI (Published version): 10.1007/s10825-009-0292-0

Published in: Journal of Computational Electronics
Published: 2009
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College: Faculty of Science and Engineering
Issue: 3-4