No Cover Image

Journal article 665 views

Simulation of statistical variability in nano-CMOS transistors using drift-diffusion, Monte Carlo and non-equilibrium Green’s function techniques

Antonio Martinez Muniz, Antonio Martinez Muniz Orcid Logo

Journal of Computational Electronics, Volume: 8, Issue: 3-4

Swansea University Author: Antonio Martinez Muniz Orcid Logo

Full text not available from this repository: check for access using links below.

DOI (Published version): 10.1007/s10825-009-0292-0

Published in: Journal of Computational Electronics
Published: 2009
URI: https://cronfa.swan.ac.uk/Record/cronfa10571
Tags: Add Tag
No Tags, Be the first to tag this record!
College: College of Engineering
Issue: 3-4