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Advanced simulation of statistical variability and reliability in nano CMOS transistors

Antonio Martinez Muniz, Antonio Martinez Muniz Orcid Logo

Swansea University Author: Antonio Martinez Muniz Orcid Logo

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DOI (Published version): 10.1109/iedm.2008.4796712

Published: 2008
URI: https://cronfa.swan.ac.uk/Record/cronfa10586
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College: College of Engineering