Journal article 1121 views
Advanced simulation of statistical variability and reliability in nano CMOS transistors
Antonio Martinez Muniz,
Antonio Martinez Muniz 
Swansea University Author:
Antonio Martinez Muniz
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DOI (Published version): 10.1109/iedm.2008.4796712
Abstract
Advanced simulation of statistical variability and reliability in nano CMOS transistors
| Published: |
2008
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa10586 |
| College: |
Faculty of Science and Engineering |
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