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Advanced simulation of statistical variability and reliability in nano CMOS transistors

Antonio Martinez Muniz, Antonio Martinez Muniz Orcid Logo

Swansea University Author: Antonio Martinez Muniz Orcid Logo

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DOI (Published version): 10.1109/iedm.2008.4796712

Published: 2008
URI: https://cronfa.swan.ac.uk/Record/cronfa10586
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first_indexed 2013-07-23T12:06:49Z
last_indexed 2018-02-09T04:39:30Z
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fullrecord <?xml version="1.0"?><rfc1807><datestamp>2013-06-10T12:01:58.5287203</datestamp><bib-version>v2</bib-version><id>10586</id><entry>2013-09-03</entry><title>Advanced simulation of statistical variability and reliability in nano CMOS transistors</title><swanseaauthors><author><sid>cd433784251add853672979313f838ec</sid><ORCID>0000-0001-8131-7242</ORCID><firstname>Antonio</firstname><surname>Martinez Muniz</surname><name>Antonio Martinez Muniz</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2013-09-03</date><deptcode>EEEG</deptcode><abstract></abstract><type>Journal Article</type><journal></journal><volume></volume><journalNumber></journalNumber><paginationStart/><paginationEnd/><publisher/><placeOfPublication/><issnPrint/><issnElectronic/><keywords/><publishedDay>31</publishedDay><publishedMonth>12</publishedMonth><publishedYear>2008</publishedYear><publishedDate>2008-12-31</publishedDate><doi>10.1109/iedm.2008.4796712</doi><url/><notes/><college>COLLEGE NANME</college><department>Electronic and Electrical Engineering</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>EEEG</DepartmentCode><institution>Swansea University</institution><apcterm/><lastEdited>2013-06-10T12:01:58.5287203</lastEdited><Created>2013-09-03T06:39:17.0000000</Created><path><level id="1">College of Engineering</level><level id="2">Engineering</level></path><authors><author><firstname>Antonio Martinez</firstname><surname>Muniz</surname><order>1</order></author><author><firstname>Antonio</firstname><surname>Martinez Muniz</surname><orcid>0000-0001-8131-7242</orcid><order>2</order></author></authors><documents/><OutputDurs/></rfc1807>
spelling 2013-06-10T12:01:58.5287203 v2 10586 2013-09-03 Advanced simulation of statistical variability and reliability in nano CMOS transistors cd433784251add853672979313f838ec 0000-0001-8131-7242 Antonio Martinez Muniz Antonio Martinez Muniz true false 2013-09-03 EEEG Journal Article 31 12 2008 2008-12-31 10.1109/iedm.2008.4796712 COLLEGE NANME Electronic and Electrical Engineering COLLEGE CODE EEEG Swansea University 2013-06-10T12:01:58.5287203 2013-09-03T06:39:17.0000000 College of Engineering Engineering Antonio Martinez Muniz 1 Antonio Martinez Muniz 0000-0001-8131-7242 2
title Advanced simulation of statistical variability and reliability in nano CMOS transistors
spellingShingle Advanced simulation of statistical variability and reliability in nano CMOS transistors
Antonio Martinez Muniz
title_short Advanced simulation of statistical variability and reliability in nano CMOS transistors
title_full Advanced simulation of statistical variability and reliability in nano CMOS transistors
title_fullStr Advanced simulation of statistical variability and reliability in nano CMOS transistors
title_full_unstemmed Advanced simulation of statistical variability and reliability in nano CMOS transistors
title_sort Advanced simulation of statistical variability and reliability in nano CMOS transistors
author_id_str_mv cd433784251add853672979313f838ec
author_id_fullname_str_mv cd433784251add853672979313f838ec_***_Antonio Martinez Muniz
author Antonio Martinez Muniz
author2 Antonio Martinez Muniz
Antonio Martinez Muniz
format Journal article
publishDate 2008
institution Swansea University
doi_str_mv 10.1109/iedm.2008.4796712
college_str College of Engineering
hierarchytype
hierarchy_top_id collegeofengineering
hierarchy_top_title College of Engineering
hierarchy_parent_id collegeofengineering
hierarchy_parent_title College of Engineering
department_str Engineering{{{_:::_}}}College of Engineering{{{_:::_}}}Engineering
document_store_str 0
active_str 0
published_date 2008-12-31T03:20:06Z
_version_ 1737024452165632000
score 10.896665