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The correlation of electronic properties with nanoscale morphological variations measured by SPM on semiconductor devices

P R Dunstan, T G G Maffeïs, M P Ackland, G T Owen, S P Wilks, Peter Dunstan Orcid Logo

Journal of Physics: Condensed Matter, Volume: 15, Issue: 42, Pages: S3095 - S3112

Swansea University Author: Peter Dunstan Orcid Logo

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DOI (Published version): 10.1088/0953-8984/15/42/008

Published in: Journal of Physics: Condensed Matter
ISSN: 0953-8984 1361-648X
Published: 2003
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URI: https://cronfa.swan.ac.uk/Record/cronfa1548
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first_indexed 2013-07-23T11:47:39Z
last_indexed 2018-02-09T04:28:53Z
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spelling 2011-10-01T00:00:00.0000000 v2 1548 2011-10-01 The correlation of electronic properties with nanoscale morphological variations measured by SPM on semiconductor devices eada15d4d33fcb3dfddcff43f1323bd6 0000-0002-4337-4307 Peter Dunstan Peter Dunstan true false 2011-10-01 SPH Journal Article Journal of Physics: Condensed Matter 15 42 S3095 S3112 0953-8984 1361-648X 31 12 2003 2003-12-31 10.1088/0953-8984/15/42/008 This invited special issue highlighted scanning tunnelling microscopy and scanning near-field optical microscopy applied to surfaces and interfaces. Dunstan's contribution was as principal investigator in the 50% of the paper concerning SNOM studies of Schottky barriers on silicon carbide. Nanoscale variations measured by photocurrents showed an inhomogeneous buried interface. COLLEGE NANME Physics COLLEGE CODE SPH Swansea University 2011-10-01T00:00:00.0000000 2011-10-01T00:00:00.0000000 Faculty of Science and Engineering School of Biosciences, Geography and Physics - Physics P R Dunstan 1 T G G Maffeïs 2 M P Ackland 3 G T Owen 4 S P Wilks 5 Peter Dunstan 0000-0002-4337-4307 6
title The correlation of electronic properties with nanoscale morphological variations measured by SPM on semiconductor devices
spellingShingle The correlation of electronic properties with nanoscale morphological variations measured by SPM on semiconductor devices
Peter Dunstan
title_short The correlation of electronic properties with nanoscale morphological variations measured by SPM on semiconductor devices
title_full The correlation of electronic properties with nanoscale morphological variations measured by SPM on semiconductor devices
title_fullStr The correlation of electronic properties with nanoscale morphological variations measured by SPM on semiconductor devices
title_full_unstemmed The correlation of electronic properties with nanoscale morphological variations measured by SPM on semiconductor devices
title_sort The correlation of electronic properties with nanoscale morphological variations measured by SPM on semiconductor devices
author_id_str_mv eada15d4d33fcb3dfddcff43f1323bd6
author_id_fullname_str_mv eada15d4d33fcb3dfddcff43f1323bd6_***_Peter Dunstan
author Peter Dunstan
author2 P R Dunstan
T G G Maffeïs
M P Ackland
G T Owen
S P Wilks
Peter Dunstan
format Journal article
container_title Journal of Physics: Condensed Matter
container_volume 15
container_issue 42
container_start_page S3095
publishDate 2003
institution Swansea University
issn 0953-8984
1361-648X
doi_str_mv 10.1088/0953-8984/15/42/008
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Biosciences, Geography and Physics - Physics{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Biosciences, Geography and Physics - Physics
document_store_str 0
active_str 0
published_date 2003-12-31T03:04:13Z
_version_ 1763749557749940224
score 11.016235

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