Journal article 693 views
Transient blocking characteristics of highly efficient junction isolations based on standard CMOS process
T.K.H Starke,
P.M Igic,
Petar Igic 
Pages: 1217 - 1222
Swansea University Author:
Petar Igic
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DOI (Published version): 10.1016/j.sse.2005.05.007
Abstract
Transient blocking characteristics of highly efficient junction isolations based on standard CMOS process
| Published: |
2005
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa1836 |
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| College: |
Faculty of Science and Engineering |
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| Start Page: |
1217 |
| End Page: |
1222 |