Operational frequency degradation induced trapping in scaled GaN HEMTs
| Date first appeared online | 21/02/2017 |
| DOI | 10.1016/j.microrel.2017.02.008 |
| Authors | Kalna K. |
| Journal Name | Microelectronics Reliability |
| Volume | 71 |
| Date first appeared online | 21/02/2017 |
| DOI | 10.1016/j.microrel.2017.02.008 |
| Authors | Kalna K. |
| Journal Name | Microelectronics Reliability |
| Volume | 71 |