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High-throughput intermittent-contact scanning probe microscopy / D.R. Sahoo; W. Häberle; A. Sebastian; H. Pozidis; E. Eleftheriou

Nanotechnology, Volume: 21, Issue: 7, Start page: 075701

Swansea University Author: Sahoo, Deepak

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Published in: Nanotechnology
ISSN: 0957-4484 1361-6528
Published: 2010
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URI: https://cronfa.swan.ac.uk/Record/cronfa32160
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College: College of Science
Issue: 7
Start Page: 075701