Journal article 1431 views
High-throughput intermittent-contact scanning probe microscopy
D.R. Sahoo,
W. Häberle,
A. Sebastian,
H. Pozidis,
E. Eleftheriou,
Deepak Sahoo 
Nanotechnology, Volume: 21, Issue: 7, Start page: 075701
Swansea University Author:
Deepak Sahoo
Full text not available from this repository: check for access using links below.
DOI (Published version): 10.1088/0957-4484/21/7/075701
Abstract
High-throughput intermittent-contact scanning probe microscopy
| Published in: | Nanotechnology |
|---|---|
| ISSN: | 0957-4484 1361-6528 |
| Published: |
2010
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| Online Access: |
Check full text
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa32160 |
| College: |
Faculty of Science and Engineering |
|---|---|
| Issue: |
7 |
| Start Page: |
075701 |