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Review: likelihood method for fitting Weibull log-linear models to accelerated life-test data

Alan Watkins Orcid Logo

IEEE Transactions on Reliability, Volume: 43, Issue: 3, Pages: 361 - 365

Swansea University Author: Alan Watkins Orcid Logo

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DOI (Published version): 10.1109/24.326426

Published in: IEEE Transactions on Reliability
ISSN: 00189529
Published: 1994
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College: Faculty of Medicine, Health and Life Sciences
Issue: 3
Start Page: 361
End Page: 365