Journal article 865 views
Quantitative characterization of defect size in graphene using Raman spectroscopy
Andrew J. Pollard,
Barry Brennan,
Helena Stec,
Bonnie J. Tyler,
Martin P. Seah,
Ian S. Gilmore,
Deb Roy 
Applied Physics Letters, Volume: 105, Issue: 25, Start page: 253107
Swansea University Author:
Deb Roy
Full text not available from this repository: check for access using links below.
DOI (Published version): 10.1063/1.4905128
Abstract
Quantitative characterization of defect size in graphene using Raman spectroscopy
| Published in: | Applied Physics Letters |
|---|---|
| ISSN: | 0003-6951 1077-3118 |
| Published: |
2014
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| Online Access: |
Check full text
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa37217 |
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| College: |
Faculty of Science and Engineering |
|---|---|
| Issue: |
25 |
| Start Page: |
253107 |