FinFET Versus Gate-All-Around Nanowire FET: Performance, Scaling, and Variability
| Date first appeared online | 09/02/2018 |
| DOI | 10.1109/JEDS.2018.2804383 |
| Authors | Nagy D., Kalna K. |
| Journal Name | IEEE Journal of the Electron Devices Society |
| Volume | 6 |
Documents
- nagy2018.pdf , Book, © 2018 IEEE. Translations and content mining are permitted for academic research only. Personal use is also permitted, but republication/redistribution requires IEEE permission
- NagyFinFet2018.pdf , Book, © 2018 IEEE. Translations and content mining are permitted for academic research only. Personal use is also permitted, but republication/redistribution requires IEEE permission