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Structural properties of self-organized organo-silicon macromolecular films investigated by scanning tunneling microscopy and X-ray diffraction

Richard Palmer Orcid Logo

Swansea University Author: Richard Palmer Orcid Logo

Published: 2000
URI: https://cronfa.swan.ac.uk/Record/cronfa49460
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last_indexed 2019-03-18T20:01:58Z
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spelling 2019-03-18T14:36:55.7818837 v2 49460 2019-03-18 Structural properties of self-organized organo-silicon macromolecular films investigated by scanning tunneling microscopy and X-ray diffraction 6ae369618efc7424d9774377536ea519 0000-0001-8728-8083 Richard Palmer Richard Palmer true false 2019-03-18 ACEM Journal Article 31 12 2000 2000-12-31 COLLEGE NANME Aerospace, Civil, Electrical, and Mechanical Engineering COLLEGE CODE ACEM Swansea University 2019-03-18T14:36:55.7818837 2019-03-18T14:36:55.7818837 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Mechanical Engineering Richard Palmer 0000-0001-8728-8083 1
title Structural properties of self-organized organo-silicon macromolecular films investigated by scanning tunneling microscopy and X-ray diffraction
spellingShingle Structural properties of self-organized organo-silicon macromolecular films investigated by scanning tunneling microscopy and X-ray diffraction
Richard Palmer
title_short Structural properties of self-organized organo-silicon macromolecular films investigated by scanning tunneling microscopy and X-ray diffraction
title_full Structural properties of self-organized organo-silicon macromolecular films investigated by scanning tunneling microscopy and X-ray diffraction
title_fullStr Structural properties of self-organized organo-silicon macromolecular films investigated by scanning tunneling microscopy and X-ray diffraction
title_full_unstemmed Structural properties of self-organized organo-silicon macromolecular films investigated by scanning tunneling microscopy and X-ray diffraction
title_sort Structural properties of self-organized organo-silicon macromolecular films investigated by scanning tunneling microscopy and X-ray diffraction
author_id_str_mv 6ae369618efc7424d9774377536ea519
author_id_fullname_str_mv 6ae369618efc7424d9774377536ea519_***_Richard Palmer
author Richard Palmer
author2 Richard Palmer
format Journal article
publishDate 2000
institution Swansea University
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Mechanical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Mechanical Engineering
document_store_str 0
active_str 0
published_date 2000-12-31T05:50:00Z
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score 11.088929

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