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Electron-beam-induced fragmentation in ultrathinC60films onSi(100)−2×1−H:Mechanisms of cage destruction

Michael R. C. Hunt, Jens Schmidt, Richard Palmer Orcid Logo

Physical Review B, Volume: 60, Issue: 8, Pages: 5927 - 5937

Swansea University Author: Richard Palmer Orcid Logo

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Published in: Physical Review B
ISSN: 0163-1829 1095-3795
Published: 1999
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URI: https://cronfa.swan.ac.uk/Record/cronfa49468
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College: College of Engineering
Issue: 8
Start Page: 5927
End Page: 5937