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Electron-beam damage of C60 films on hydrogen-passivated Si(100)

Michael R. C. Hunt, Jens Schmidt, Richard Palmer Orcid Logo

Applied Physics Letters, Volume: 72, Issue: 3, Pages: 323 - 325

Swansea University Author: Richard Palmer Orcid Logo

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DOI (Published version): 10.1063/1.120725

Published in: Applied Physics Letters
ISSN: 0003-6951 1077-3118
Published: 1998
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URI: https://cronfa.swan.ac.uk/Record/cronfa49485
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College: College of Engineering
Issue: 3
Start Page: 323
End Page: 325