Journal article 910 views
Electron-beam damage of C60 films on hydrogen-passivated Si(100)
Applied Physics Letters, Volume: 72, Issue: 3, Pages: 323 - 325
Swansea University Author:
Richard Palmer
Full text not available from this repository: check for access using links below.
DOI (Published version): 10.1063/1.120725
Abstract
Electron-beam damage of C60 films on hydrogen-passivated Si(100)
| Published in: | Applied Physics Letters |
|---|---|
| ISSN: | 0003-6951 1077-3118 |
| Published: |
1998
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| Online Access: |
Check full text
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa49485 |
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2019-03-18T20:02:01Z |
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| last_indexed |
2019-03-18T20:02:01Z |
| id |
cronfa49485 |
| recordtype |
SURis |
| fullrecord |
<?xml version="1.0"?><rfc1807><datestamp>2019-03-18T14:37:43.7080814</datestamp><bib-version>v2</bib-version><id>49485</id><entry>2019-03-18</entry><title>Electron-beam damage of C60 films on hydrogen-passivated Si(100)</title><swanseaauthors><author><sid>6ae369618efc7424d9774377536ea519</sid><ORCID>0000-0001-8728-8083</ORCID><firstname>Richard</firstname><surname>Palmer</surname><name>Richard Palmer</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2019-03-18</date><deptcode>ACEM</deptcode><abstract/><type>Journal Article</type><journal>Applied Physics Letters</journal><volume>72</volume><journalNumber>3</journalNumber><paginationStart>323</paginationStart><paginationEnd>325</paginationEnd><publisher/><placeOfPublication/><isbnPrint/><isbnElectronic/><issnPrint>0003-6951</issnPrint><issnElectronic>1077-3118</issnElectronic><keywords/><publishedDay>31</publishedDay><publishedMonth>12</publishedMonth><publishedYear>1998</publishedYear><publishedDate>1998-12-31</publishedDate><doi>10.1063/1.120725</doi><url/><notes/><college>COLLEGE NANME</college><department>Aerospace, Civil, Electrical, and Mechanical Engineering</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>ACEM</DepartmentCode><institution>Swansea University</institution><apcterm/><lastEdited>2019-03-18T14:37:43.7080814</lastEdited><Created>2019-03-18T14:37:43.4740771</Created><path><level id="1">Faculty of Science and Engineering</level><level id="2">School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Mechanical Engineering</level></path><authors><author><firstname>Michael R. C.</firstname><surname>Hunt</surname><order>1</order></author><author><firstname>Jens</firstname><surname>Schmidt</surname><order>2</order></author><author><firstname>Richard</firstname><surname>Palmer</surname><orcid>0000-0001-8728-8083</orcid><order>3</order></author></authors><documents/><OutputDurs/></rfc1807> |
| spelling |
2019-03-18T14:37:43.7080814 v2 49485 2019-03-18 Electron-beam damage of C60 films on hydrogen-passivated Si(100) 6ae369618efc7424d9774377536ea519 0000-0001-8728-8083 Richard Palmer Richard Palmer true false 2019-03-18 ACEM Journal Article Applied Physics Letters 72 3 323 325 0003-6951 1077-3118 31 12 1998 1998-12-31 10.1063/1.120725 COLLEGE NANME Aerospace, Civil, Electrical, and Mechanical Engineering COLLEGE CODE ACEM Swansea University 2019-03-18T14:37:43.7080814 2019-03-18T14:37:43.4740771 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Mechanical Engineering Michael R. C. Hunt 1 Jens Schmidt 2 Richard Palmer 0000-0001-8728-8083 3 |
| title |
Electron-beam damage of C60 films on hydrogen-passivated Si(100) |
| spellingShingle |
Electron-beam damage of C60 films on hydrogen-passivated Si(100) Richard Palmer |
| title_short |
Electron-beam damage of C60 films on hydrogen-passivated Si(100) |
| title_full |
Electron-beam damage of C60 films on hydrogen-passivated Si(100) |
| title_fullStr |
Electron-beam damage of C60 films on hydrogen-passivated Si(100) |
| title_full_unstemmed |
Electron-beam damage of C60 films on hydrogen-passivated Si(100) |
| title_sort |
Electron-beam damage of C60 films on hydrogen-passivated Si(100) |
| author_id_str_mv |
6ae369618efc7424d9774377536ea519 |
| author_id_fullname_str_mv |
6ae369618efc7424d9774377536ea519_***_Richard Palmer |
| author |
Richard Palmer |
| author2 |
Michael R. C. Hunt Jens Schmidt Richard Palmer |
| format |
Journal article |
| container_title |
Applied Physics Letters |
| container_volume |
72 |
| container_issue |
3 |
| container_start_page |
323 |
| publishDate |
1998 |
| institution |
Swansea University |
| issn |
0003-6951 1077-3118 |
| doi_str_mv |
10.1063/1.120725 |
| college_str |
Faculty of Science and Engineering |
| hierarchytype |
|
| hierarchy_top_id |
facultyofscienceandengineering |
| hierarchy_top_title |
Faculty of Science and Engineering |
| hierarchy_parent_id |
facultyofscienceandengineering |
| hierarchy_parent_title |
Faculty of Science and Engineering |
| department_str |
School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Mechanical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Mechanical Engineering |
| document_store_str |
0 |
| active_str |
0 |
| published_date |
1998-12-31T05:50:07Z |
| _version_ |
1850736857982173184 |
| score |
11.08895 |

