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Atomic force microscopy and scanning tunneling microscopy-spectroscopy characterization of ZnO nanobelts / Christopher Wright, Steve Wilks, Thierry Maffeis, Rowan Brown

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Swansea University Authors: Christopher Wright, Steve Wilks, Thierry Maffeis, Rowan Brown

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DOI (Published version): 10.1116/1.2838048

Published in: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
Published: 2008
URI: https://cronfa.swan.ac.uk/Record/cronfa5469
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College: College of Engineering