Journal article 1212 views
Atomic force microscopy and scanning tunneling microscopy-spectroscopy characterization of ZnO nanobelts
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
Swansea University Authors: Christopher Wright , Steve Wilks, Thierry Maffeis , Rowan Brown
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DOI (Published version): 10.1116/1.2838048
Abstract
Atomic force microscopy and scanning tunneling microscopy-spectroscopy characterization of ZnO nanobelts
Published in: | Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures |
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Published: |
2008
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URI: | https://cronfa.swan.ac.uk/Record/cronfa5469 |
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College: |
Faculty of Science and Engineering |
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