Surface defects in semiconductor lasers studied with cross-sectional scanning tunneling microscopy
| Date first appeared online | 15/07/2010 |
| DOI | 10.1016/j.apsusc.2010.03.089 |
| Authors | Cobley R., Wilks S., Teng V., Brown R., Rees P. |
| Journal Name | Applied Surface Science |
| Volume | 256 |