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Direct real-time observation of catastrophic optical degradation in operating semiconductor lasers using scanning tunneling microscopy

R. J. Cobley, K. S. Teng, M. R. Brown, S. P. Wilks, P. Rees, Steve Wilks, Vincent Teng Orcid Logo, Rowan Brown Orcid Logo, Richard Cobley Orcid Logo, Paul Rees Orcid Logo

Applied Physics Letters, Volume: 91, Issue: 8, Start page: 081119

Swansea University Authors: Steve Wilks , Vincent Teng Orcid Logo, Rowan Brown Orcid Logo, Richard Cobley Orcid Logo, Paul Rees Orcid Logo

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DOI (Published version): 10.1063/1.2775049

Published in: Applied Physics Letters
Published: 2007
URI: https://cronfa.swan.ac.uk/Record/cronfa1828
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College: College of Science
Issue: 8
Start Page: 081119