Journal article 1201 views
Analyzing real-time surface modification of operating semiconductor laser diodes using cross-sectional scanning tunneling microscopy
R. J. Cobley,
P. Rees,
K. S. Teng,
S. P. Wilks,
Steve Wilks,
Vincent Teng ,
Richard Cobley ,
Paul Rees
Journal of Applied Physics, Volume: 107, Issue: 9, Start page: 094507
Swansea University Authors: Steve Wilks, Vincent Teng , Richard Cobley , Paul Rees
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DOI (Published version): 10.1063/1.3380826
Abstract
Analyzing real-time surface modification of operating semiconductor laser diodes using cross-sectional scanning tunneling microscopy
Published in: | Journal of Applied Physics |
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ISBN: | N/A |
ISSN: | 00218979 |
Published: |
2010
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Online Access: |
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URI: | https://cronfa.swan.ac.uk/Record/cronfa5566 |
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College: |
Faculty of Science and Engineering |
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Issue: |
9 |
Start Page: |
094507 |