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Analyzing real-time surface modification of operating semiconductor laser diodes using cross-sectional scanning tunneling microscopy / R. J. Cobley, P. Rees, K. S. Teng, S. P. Wilks, Steve Wilks, Vincent Teng, Richard Cobley, Paul Rees

Journal of Applied Physics, Volume: 107, Issue: 9, Start page: 094507

Swansea University Authors: Steve Wilks, Vincent Teng, Richard Cobley, Paul Rees

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DOI (Published version): 10.1063/1.3380826

Published in: Journal of Applied Physics
ISBN: N/A
ISSN: 00218979
Published: 2010
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URI: https://cronfa.swan.ac.uk/Record/cronfa5566
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College: College of Science
Issue: 9
Start Page: 094507