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Analyzing real-time surface modification of operating semiconductor laser diodes using cross-sectional scanning tunneling microscopy

R. J. Cobley, P. Rees, K. S. Teng, S. P. Wilks, Steve Wilks, Vincent Teng Orcid Logo, Richard Cobley Orcid Logo, Paul Rees Orcid Logo

Journal of Applied Physics, Volume: 107, Issue: 9, Start page: 094507

Swansea University Authors: Steve Wilks, Vincent Teng Orcid Logo, Richard Cobley Orcid Logo, Paul Rees Orcid Logo

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DOI (Published version): 10.1063/1.3380826

Published in: Journal of Applied Physics
ISBN: N/A
ISSN: 00218979
Published: 2010
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URI: https://cronfa.swan.ac.uk/Record/cronfa5566
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College: College of Science
Issue: 9
Start Page: 094507