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Analyzing real-time surface modification of operating semiconductor laser diodes using cross-sectional scanning tunneling microscopy

R. J. Cobley, P. Rees, K. S. Teng, S. P. Wilks, Steve Wilks, Vincent Teng Orcid Logo, Richard Cobley Orcid Logo, Paul Rees Orcid Logo

Journal of Applied Physics, Volume: 107, Issue: 9, Start page: 094507

Swansea University Authors: Steve Wilks, Vincent Teng Orcid Logo, Richard Cobley Orcid Logo, Paul Rees Orcid Logo

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DOI (Published version): 10.1063/1.3380826

Published in: Journal of Applied Physics
ISBN: N/A
ISSN: 00218979
Published: 2010
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URI: https://cronfa.swan.ac.uk/Record/cronfa5566
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first_indexed 2013-07-23T11:53:02Z
last_indexed 2018-02-09T04:31:59Z
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spelling 2016-11-11T15:46:28.6283869 v2 5566 2013-09-03 Analyzing real-time surface modification of operating semiconductor laser diodes using cross-sectional scanning tunneling microscopy 948a547e27d969b7e192b4620688704d Steve Wilks Steve Wilks true false 98f529f56798da1ba3e6e93d2817c114 0000-0003-4325-8573 Vincent Teng Vincent Teng true false 2ce7e1dd9006164425415a35fa452494 0000-0003-4833-8492 Richard Cobley Richard Cobley true false 537a2fe031a796a3bde99679ee8c24f5 0000-0002-7715-6914 Paul Rees Paul Rees true false 2013-09-03 SMT Journal Article Journal of Applied Physics 107 9 094507 N/A 00218979 31 12 2010 2010-12-31 10.1063/1.3380826 COLLEGE NANME Senior Leadership Team COLLEGE CODE SMT Swansea University 2016-11-11T15:46:28.6283869 2013-09-03T06:12:45.0000000 College of Science Biosciences R. J. Cobley 1 P. Rees 2 K. S. Teng 3 S. P. Wilks 4 Steve Wilks 5 Vincent Teng 0000-0003-4325-8573 6 Richard Cobley 0000-0003-4833-8492 7 Paul Rees 0000-0002-7715-6914 8
title Analyzing real-time surface modification of operating semiconductor laser diodes using cross-sectional scanning tunneling microscopy
spellingShingle Analyzing real-time surface modification of operating semiconductor laser diodes using cross-sectional scanning tunneling microscopy
Steve Wilks
Vincent Teng
Richard Cobley
Paul Rees
title_short Analyzing real-time surface modification of operating semiconductor laser diodes using cross-sectional scanning tunneling microscopy
title_full Analyzing real-time surface modification of operating semiconductor laser diodes using cross-sectional scanning tunneling microscopy
title_fullStr Analyzing real-time surface modification of operating semiconductor laser diodes using cross-sectional scanning tunneling microscopy
title_full_unstemmed Analyzing real-time surface modification of operating semiconductor laser diodes using cross-sectional scanning tunneling microscopy
title_sort Analyzing real-time surface modification of operating semiconductor laser diodes using cross-sectional scanning tunneling microscopy
author_id_str_mv 948a547e27d969b7e192b4620688704d
98f529f56798da1ba3e6e93d2817c114
2ce7e1dd9006164425415a35fa452494
537a2fe031a796a3bde99679ee8c24f5
author_id_fullname_str_mv 948a547e27d969b7e192b4620688704d_***_Steve Wilks
98f529f56798da1ba3e6e93d2817c114_***_Vincent Teng
2ce7e1dd9006164425415a35fa452494_***_Richard Cobley
537a2fe031a796a3bde99679ee8c24f5_***_Paul Rees
author Steve Wilks
Vincent Teng
Richard Cobley
Paul Rees
author2 R. J. Cobley
P. Rees
K. S. Teng
S. P. Wilks
Steve Wilks
Vincent Teng
Richard Cobley
Paul Rees
format Journal article
container_title Journal of Applied Physics
container_volume 107
container_issue 9
container_start_page 094507
publishDate 2010
institution Swansea University
isbn N/A
issn 00218979
doi_str_mv 10.1063/1.3380826
college_str College of Science
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hierarchy_top_title College of Science
hierarchy_parent_id collegeofscience
hierarchy_parent_title College of Science
department_str Biosciences{{{_:::_}}}College of Science{{{_:::_}}}Biosciences
document_store_str 0
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published_date 2010-12-31T03:20:06Z
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