Cross-sectional scanning tunneling microscopy of biased semiconductor lasers
| Date first appeared online | |
| DOI | 10.1063/1.2757006 |
| Authors | Teng V., Brown R., Cobley R. |
| Journal Name | Journal of Applied Physics |
| Volume | 102 |
| Date first appeared online | |
| DOI | 10.1063/1.2757006 |
| Authors | Teng V., Brown R., Cobley R. |
| Journal Name | Journal of Applied Physics |
| Volume | 102 |