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Cross-sectional scanning tunneling microscopy of biased semiconductor lasers / R. J Cobley, K. S Teng, M. R Brown, S. P Wilks, Vincent Teng, Rowan Brown, Richard Cobley

Journal of Applied Physics, Volume: 102, Start page: 024306

Swansea University Authors: Vincent Teng, Rowan Brown, Richard Cobley

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DOI (Published version): 10.1063/1.2757006

Published in: Journal of Applied Physics
Published: 2007
URI: https://cronfa.swan.ac.uk/Record/cronfa1852
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College: College of Engineering
Start Page: 024306