No Cover Image

Journal article 638 views

Cross-sectional scanning tunneling microscopy of biased semiconductor lasers / R. J Cobley, K. S Teng, M. R Brown, S. P Wilks, Vincent Teng, Rowan Brown, Richard Cobley

Journal of Applied Physics, Volume: 102, Start page: 024306

Swansea University Authors: Vincent Teng, Rowan Brown, Richard Cobley

Full text not available from this repository: check for access using links below.

DOI (Published version): 10.1063/1.2757006

Published in: Journal of Applied Physics
Published: 2007
Tags: Add Tag
No Tags, Be the first to tag this record!
College: College of Engineering
Start Page: 024306