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Cross-sectional scanning tunneling microscopy of biased semiconductor lasers / R. J Cobley, K. S Teng, M. R Brown, S. P Wilks, Vincent Teng, Rowan Brown, Richard Cobley

Journal of Applied Physics, Volume: 102, Start page: 024306

Swansea University Authors: Vincent Teng, Rowan Brown, Richard Cobley

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DOI (Published version): 10.1063/1.2757006

Published in: Journal of Applied Physics
Published: 2007
URI: https://cronfa.swan.ac.uk/Record/cronfa1852
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spelling 2011-10-01T00:00:00.0000000 v2 1852 2011-10-01 Cross-sectional scanning tunneling microscopy of biased semiconductor lasers 98f529f56798da1ba3e6e93d2817c114 0000-0003-4325-8573 Vincent Teng Vincent Teng true false d7db8d42c476dfa69c15ce06d29bd863 0000-0003-3628-2524 Rowan Brown Rowan Brown true false 2ce7e1dd9006164425415a35fa452494 0000-0003-4833-8492 Richard Cobley Richard Cobley true false 2011-10-01 EEEG Journal Article Journal of Applied Physics 102 024306 31 12 2007 2007-12-31 10.1063/1.2757006 COLLEGE NANME Electronic and Electrical Engineering COLLEGE CODE EEEG Swansea University 2011-10-01T00:00:00.0000000 2011-10-01T00:00:00.0000000 College of Engineering Engineering R. J Cobley 1 K. S Teng 2 M. R Brown 3 S. P Wilks 4 Vincent Teng 0000-0003-4325-8573 5 Rowan Brown 0000-0003-3628-2524 6 Richard Cobley 0000-0003-4833-8492 7
title Cross-sectional scanning tunneling microscopy of biased semiconductor lasers
spellingShingle Cross-sectional scanning tunneling microscopy of biased semiconductor lasers
Vincent, Teng
Rowan, Brown
Richard, Cobley
title_short Cross-sectional scanning tunneling microscopy of biased semiconductor lasers
title_full Cross-sectional scanning tunneling microscopy of biased semiconductor lasers
title_fullStr Cross-sectional scanning tunneling microscopy of biased semiconductor lasers
title_full_unstemmed Cross-sectional scanning tunneling microscopy of biased semiconductor lasers
title_sort Cross-sectional scanning tunneling microscopy of biased semiconductor lasers
author_id_str_mv 98f529f56798da1ba3e6e93d2817c114
d7db8d42c476dfa69c15ce06d29bd863
2ce7e1dd9006164425415a35fa452494
author_id_fullname_str_mv 98f529f56798da1ba3e6e93d2817c114_***_Vincent, Teng
d7db8d42c476dfa69c15ce06d29bd863_***_Rowan, Brown
2ce7e1dd9006164425415a35fa452494_***_Richard, Cobley
author Vincent, Teng
Rowan, Brown
Richard, Cobley
author2 R. J Cobley
K. S Teng
M. R Brown
S. P Wilks
Vincent Teng
Rowan Brown
Richard Cobley
format Journal article
container_title Journal of Applied Physics
container_volume 102
container_start_page 024306
publishDate 2007
institution Swansea University
doi_str_mv 10.1063/1.2757006
college_str College of Engineering
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hierarchy_top_id collegeofengineering
hierarchy_top_title College of Engineering
hierarchy_parent_id collegeofengineering
hierarchy_parent_title College of Engineering
department_str Engineering{{{_:::_}}}College of Engineering{{{_:::_}}}Engineering
document_store_str 0
active_str 0
published_date 2007-12-31T03:15:05Z
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