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Direct real-time observation of catastrophic optical degradation in operating semiconductor lasers using scanning tunneling microscopy

R. J. Cobley, K. S. Teng, M. R. Brown, S. P. Wilks, P. Rees, Steve Wilks, Vincent Teng Orcid Logo, Rowan Brown Orcid Logo, Richard Cobley Orcid Logo, Paul Rees Orcid Logo

Applied Physics Letters, Volume: 91, Issue: 8, Start page: 081119

Swansea University Authors: Steve Wilks, Vincent Teng Orcid Logo, Rowan Brown Orcid Logo, Richard Cobley Orcid Logo, Paul Rees Orcid Logo

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DOI (Published version): 10.1063/1.2775049

Published in: Applied Physics Letters
Published: 2007
URI: https://cronfa.swan.ac.uk/Record/cronfa1828
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fullrecord <?xml version="1.0"?><rfc1807><datestamp>2015-10-20T13:37:15.6453375</datestamp><bib-version>v2</bib-version><id>1828</id><entry>2011-10-01</entry><title>Direct real-time observation of catastrophic optical degradation in operating semiconductor lasers using scanning tunneling microscopy</title><swanseaauthors><author><sid>948a547e27d969b7e192b4620688704d</sid><ORCID/><firstname>Steve</firstname><surname>Wilks</surname><name>Steve Wilks</name><active>true</active><ethesisStudent>false</ethesisStudent></author><author><sid>98f529f56798da1ba3e6e93d2817c114</sid><ORCID>0000-0003-4325-8573</ORCID><firstname>Vincent</firstname><surname>Teng</surname><name>Vincent Teng</name><active>true</active><ethesisStudent>false</ethesisStudent></author><author><sid>d7db8d42c476dfa69c15ce06d29bd863</sid><ORCID>0000-0003-3628-2524</ORCID><firstname>Rowan</firstname><surname>Brown</surname><name>Rowan Brown</name><active>true</active><ethesisStudent>false</ethesisStudent></author><author><sid>2ce7e1dd9006164425415a35fa452494</sid><ORCID>0000-0003-4833-8492</ORCID><firstname>Richard</firstname><surname>Cobley</surname><name>Richard Cobley</name><active>true</active><ethesisStudent>false</ethesisStudent></author><author><sid>537a2fe031a796a3bde99679ee8c24f5</sid><ORCID>0000-0002-7715-6914</ORCID><firstname>Paul</firstname><surname>Rees</surname><name>Paul Rees</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2011-10-01</date><deptcode>SMT</deptcode><abstract></abstract><type>Journal Article</type><journal>Applied Physics Letters</journal><volume>91</volume><journalNumber>8</journalNumber><paginationStart>081119</paginationStart><publisher/><issnPrint/><issnElectronic/><keywords/><publishedDay>31</publishedDay><publishedMonth>12</publishedMonth><publishedYear>2007</publishedYear><publishedDate>2007-12-31</publishedDate><doi>10.1063/1.2775049</doi><url/><notes/><college>COLLEGE NANME</college><department>Senior Leadership Team</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>SMT</DepartmentCode><institution>Swansea University</institution><apcterm/><lastEdited>2015-10-20T13:37:15.6453375</lastEdited><Created>2011-10-01T00:00:00.0000000</Created><path><level id="1">College of Science</level><level id="2">Biosciences</level></path><authors><author><firstname>R. J.</firstname><surname>Cobley</surname><order>1</order></author><author><firstname>K. S.</firstname><surname>Teng</surname><order>2</order></author><author><firstname>M. R.</firstname><surname>Brown</surname><order>3</order></author><author><firstname>S. P.</firstname><surname>Wilks</surname><order>4</order></author><author><firstname>P.</firstname><surname>Rees</surname><order>5</order></author><author><firstname>Steve</firstname><surname>Wilks</surname><orcid/><order>6</order></author><author><firstname>Vincent</firstname><surname>Teng</surname><orcid>0000-0003-4325-8573</orcid><order>7</order></author><author><firstname>Rowan</firstname><surname>Brown</surname><orcid>0000-0003-3628-2524</orcid><order>8</order></author><author><firstname>Richard</firstname><surname>Cobley</surname><orcid>0000-0003-4833-8492</orcid><order>9</order></author><author><firstname>Paul</firstname><surname>Rees</surname><orcid>0000-0002-7715-6914</orcid><order>10</order></author></authors><documents/><OutputDurs/></rfc1807>
spelling 2015-10-20T13:37:15.6453375 v2 1828 2011-10-01 Direct real-time observation of catastrophic optical degradation in operating semiconductor lasers using scanning tunneling microscopy 948a547e27d969b7e192b4620688704d Steve Wilks Steve Wilks true false 98f529f56798da1ba3e6e93d2817c114 0000-0003-4325-8573 Vincent Teng Vincent Teng true false d7db8d42c476dfa69c15ce06d29bd863 0000-0003-3628-2524 Rowan Brown Rowan Brown true false 2ce7e1dd9006164425415a35fa452494 0000-0003-4833-8492 Richard Cobley Richard Cobley true false 537a2fe031a796a3bde99679ee8c24f5 0000-0002-7715-6914 Paul Rees Paul Rees true false 2011-10-01 SMT Journal Article Applied Physics Letters 91 8 081119 31 12 2007 2007-12-31 10.1063/1.2775049 COLLEGE NANME Senior Leadership Team COLLEGE CODE SMT Swansea University 2015-10-20T13:37:15.6453375 2011-10-01T00:00:00.0000000 College of Science Biosciences R. J. Cobley 1 K. S. Teng 2 M. R. Brown 3 S. P. Wilks 4 P. Rees 5 Steve Wilks 6 Vincent Teng 0000-0003-4325-8573 7 Rowan Brown 0000-0003-3628-2524 8 Richard Cobley 0000-0003-4833-8492 9 Paul Rees 0000-0002-7715-6914 10
title Direct real-time observation of catastrophic optical degradation in operating semiconductor lasers using scanning tunneling microscopy
spellingShingle Direct real-time observation of catastrophic optical degradation in operating semiconductor lasers using scanning tunneling microscopy
Steve Wilks
Vincent Teng
Rowan Brown
Richard Cobley
Paul Rees
title_short Direct real-time observation of catastrophic optical degradation in operating semiconductor lasers using scanning tunneling microscopy
title_full Direct real-time observation of catastrophic optical degradation in operating semiconductor lasers using scanning tunneling microscopy
title_fullStr Direct real-time observation of catastrophic optical degradation in operating semiconductor lasers using scanning tunneling microscopy
title_full_unstemmed Direct real-time observation of catastrophic optical degradation in operating semiconductor lasers using scanning tunneling microscopy
title_sort Direct real-time observation of catastrophic optical degradation in operating semiconductor lasers using scanning tunneling microscopy
author_id_str_mv 948a547e27d969b7e192b4620688704d
98f529f56798da1ba3e6e93d2817c114
d7db8d42c476dfa69c15ce06d29bd863
2ce7e1dd9006164425415a35fa452494
537a2fe031a796a3bde99679ee8c24f5
author_id_fullname_str_mv 948a547e27d969b7e192b4620688704d_***_Steve Wilks
98f529f56798da1ba3e6e93d2817c114_***_Vincent Teng
d7db8d42c476dfa69c15ce06d29bd863_***_Rowan Brown
2ce7e1dd9006164425415a35fa452494_***_Richard Cobley
537a2fe031a796a3bde99679ee8c24f5_***_Paul Rees
author Steve Wilks
Vincent Teng
Rowan Brown
Richard Cobley
Paul Rees
author2 R. J. Cobley
K. S. Teng
M. R. Brown
S. P. Wilks
P. Rees
Steve Wilks
Vincent Teng
Rowan Brown
Richard Cobley
Paul Rees
format Journal article
container_title Applied Physics Letters
container_volume 91
container_issue 8
container_start_page 081119
publishDate 2007
institution Swansea University
doi_str_mv 10.1063/1.2775049
college_str College of Science
hierarchytype
hierarchy_top_id collegeofscience
hierarchy_top_title College of Science
hierarchy_parent_id collegeofscience
hierarchy_parent_title College of Science
department_str Biosciences{{{_:::_}}}College of Science{{{_:::_}}}Biosciences
document_store_str 0
active_str 0
published_date 2007-12-31T03:18:04Z
_version_ 1734034623744180224
score 10.87277