Conference Paper/Proceeding/Abstract 1203 views
A study of latch-up robustness for a new p-buffer CMOS based Power IC Technology architecture
P.M Holland,
M. P Elwin,
S Batcup,
Z Zhou,
P. M Igic,
Paul Holland
Microelectronics, 2008. MIEL 2008. 26th International Conference on, Pages: 177 - 179
Swansea University Author: Paul Holland
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DOI (Published version): 10.1109/ICMEL.2008.4559252
Abstract
A study of latch-up robustness for a new p-buffer CMOS based Power IC Technology architecture
| Published in: | Microelectronics, 2008. MIEL 2008. 26th International Conference on |
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| Published: |
2008
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa5751 |
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| Item Description: |
A study of latch-up robustness for a new p-buffer CMOS based Power IC Technology architecture.This paper presents a novel approach to implement a high voltage transistor into a CMOS process and study the effects on circuit reliability. |
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| College: |
Faculty of Science and Engineering |
| Start Page: |
177 |
| End Page: |
179 |