Journal article 1067 views
Control of roughness at interfaces and the impact on charge mobility in all-polymer field-effect transistors
Shion Seng Chang,
Ana B Rodríguez,
Anthony Higgins 
,
Chuan Liu,
Mark Geoghegan,
Henning Sirringhaus,
Fabrice Cousin,
Robert M Dalgleish,
Yvonne Deng
,
Chuan Liu,
Mark Geoghegan,
Henning Sirringhaus,
Fabrice Cousin,
Robert M Dalgleish,
Yvonne Deng
Soft Matter, Volume: 4, Issue: 11, Pages: 2220 - 2224
Swansea University Author:
Anthony Higgins
Full text not available from this repository: check for access using links below.
DOI (Published version): 10.1039/b810278c
Abstract
Control of roughness at interfaces and the impact on charge mobility in all-polymer field-effect transistors
| Published in: | Soft Matter |
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| ISSN: | 1744-683X 1744-6848 |
| Published: |
2008
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| Online Access: |
Check full text
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa5781 |
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| Item Description: |
This project was a collaboration with Prof H. Sirringhaus FRS (Physics, Cambridge) and was led by A. M. Higgins. This project involved structural studies in Swansea/central facilities (funded by STFC PI A. M. Higgins) and electronic device fabrication/characterisation in Cambridge. The work used a novel methodology to control interfacial roughness via solvent quality, and demonstrated the influence of roughness on charge mobility at a buried all-polymer semiconducting/dielectric interface within a field-effect transistor. |
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| College: |
Faculty of Science and Engineering |
| Issue: |
11 |
| Start Page: |
2220 |
| End Page: |
2224 |