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Quantitative analysis of carbon impurity concentrations in GaN epilayers by cathodoluminescence

K. Loeto, G. Kusch, Saptarsi Ghosh Orcid Logo, M.J. Kappers, R.A. Oliver

Micron, Volume: 172, Start page: 103489

Swansea University Author: Saptarsi Ghosh Orcid Logo

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Published in: Micron
ISSN: 0968-4328
Published: Elsevier BV 2023
Online Access: Check full text

URI: https://cronfa.swan.ac.uk/Record/cronfa66867
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College: Faculty of Science and Engineering
Start Page: 103489