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Quantitative analysis of carbon impurity concentrations in GaN epilayers by cathodoluminescence

K. Loeto, G. Kusch, Saptarsi Ghosh Orcid Logo, M.J. Kappers, R.A. Oliver

Micron, Volume: 172, Start page: 103489

Swansea University Author: Saptarsi Ghosh Orcid Logo

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Published in: Micron
ISSN: 0968-4328
Published: Elsevier BV 2023
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URI: https://cronfa.swan.ac.uk/Record/cronfa66867
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first_indexed 2024-07-04T16:52:18Z
last_indexed 2024-07-04T16:52:18Z
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spelling v2 66867 2024-06-23 Quantitative analysis of carbon impurity concentrations in GaN epilayers by cathodoluminescence 3e247ecabd6eddd319264d066b0ce959 0000-0003-1685-6228 Saptarsi Ghosh Saptarsi Ghosh true false 2024-06-23 ACEM Journal Article Micron 172 103489 Elsevier BV 0968-4328 1 9 2023 2023-09-01 10.1016/j.micron.2023.103489 http://dx.doi.org/10.1016/j.micron.2023.103489 COLLEGE NANME Aerospace, Civil, Electrical, and Mechanical Engineering COLLEGE CODE ACEM Swansea University 2024-07-04T17:52:20.1046675 2024-06-23T19:50:08.2896376 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering K. Loeto 1 G. Kusch 2 Saptarsi Ghosh 0000-0003-1685-6228 3 M.J. Kappers 4 R.A. Oliver 5
title Quantitative analysis of carbon impurity concentrations in GaN epilayers by cathodoluminescence
spellingShingle Quantitative analysis of carbon impurity concentrations in GaN epilayers by cathodoluminescence
Saptarsi Ghosh
title_short Quantitative analysis of carbon impurity concentrations in GaN epilayers by cathodoluminescence
title_full Quantitative analysis of carbon impurity concentrations in GaN epilayers by cathodoluminescence
title_fullStr Quantitative analysis of carbon impurity concentrations in GaN epilayers by cathodoluminescence
title_full_unstemmed Quantitative analysis of carbon impurity concentrations in GaN epilayers by cathodoluminescence
title_sort Quantitative analysis of carbon impurity concentrations in GaN epilayers by cathodoluminescence
author_id_str_mv 3e247ecabd6eddd319264d066b0ce959
author_id_fullname_str_mv 3e247ecabd6eddd319264d066b0ce959_***_Saptarsi Ghosh
author Saptarsi Ghosh
author2 K. Loeto
G. Kusch
Saptarsi Ghosh
M.J. Kappers
R.A. Oliver
format Journal article
container_title Micron
container_volume 172
container_start_page 103489
publishDate 2023
institution Swansea University
issn 0968-4328
doi_str_mv 10.1016/j.micron.2023.103489
publisher Elsevier BV
college_str Faculty of Science and Engineering
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hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering
url http://dx.doi.org/10.1016/j.micron.2023.103489
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published_date 2023-09-01T17:52:18Z
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