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Monte Carlo Study of Ultimate Channel Scaling in Si and In0.3Ga0.7As Bulk MOSFETs / Karol Kalna

IEEE Transactions on Nanotechnology, Volume: 10, Issue: 6

Swansea University Author: Karol Kalna

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DOI (Published version): 10.1109/TNANO.2011.2165555

Published in: IEEE Transactions on Nanotechnology
Published: 2011
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College: College of Engineering
Issue: 6