No Cover Image

Journal article 846 views

Monte Carlo Study of Ultimate Channel Scaling in Si and In0.3Ga0.7As Bulk MOSFETs

Karol Kalna Orcid Logo

IEEE Transactions on Nanotechnology, Volume: 10, Issue: 6

Swansea University Author: Karol Kalna Orcid Logo

Full text not available from this repository: check for access using links below.

DOI (Published version): 10.1109/TNANO.2011.2165555

Published in: IEEE Transactions on Nanotechnology
Published: 2011
Tags: Add Tag
No Tags, Be the first to tag this record!
College: Faculty of Science and Engineering
Issue: 6