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Effect of interface state trap density on the performance of scaled surface channel In<sub>0.3</sub>Ga<sub>0.7</sub>As MOSFETs

Karol Kalna Orcid Logo

Journal of Physics: Conference Series

Swansea University Author: Karol Kalna Orcid Logo

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DOI (Published version): 10.1088/1742-6596/193/1/012122

Published in: Journal of Physics: Conference Series
Published: 2009
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College: Faculty of Science and Engineering