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Study of surface roughness in extremely small Si nanowire MOSFETs using fully-3D NEGFs

Antonio Martinez Muniz, Antonio Martinez Muniz Orcid Logo

Swansea University Author: Antonio Martinez Muniz Orcid Logo

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DOI (Published version): 10.1109/sced.2009.4800460

Published: 2009
URI: https://cronfa.swan.ac.uk/Record/cronfa10574
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College: College of Engineering