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A detailed 3D-NEGF simulation study of tunnelling in n-Si nanowire MOSFETs

Antonio Martinez Muniz, Antonio Martinez Muniz Orcid Logo

Swansea University Author: Antonio Martinez Muniz Orcid Logo

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DOI (Published version): 10.1109/snw.2010.5562591

Published: 2010
URI: https://cronfa.swan.ac.uk/Record/cronfa10572
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College: College of Engineering