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The effect of interface roughness on multilayer heterostructures

Martyn Rowan Brown, Paul Rees Orcid Logo, Richard Cobley Orcid Logo, Kar Seng Teng, Steve Wilks, Arwel Hughes, Vincent Teng Orcid Logo, Rowan Brown Orcid Logo

Journal of Applied Physics, Volume: 102, Issue: 11, Start page: 113711

Swansea University Authors: Paul Rees Orcid Logo, Richard Cobley Orcid Logo, Steve Wilks , Vincent Teng Orcid Logo, Rowan Brown Orcid Logo

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DOI (Published version): 10.1063/1.2818108

Published in: Journal of Applied Physics
ISSN: 0021-8979
Published: 2007
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URI: https://cronfa.swan.ac.uk/Record/cronfa12713
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College: College of Engineering
Issue: 11
Start Page: 113711