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Impurity-induced disordering in AlGaInP superlattices studied using cross-sectional scanning tunneling microscopy / K. S Teng, M. R Brown, S. P Wilks, A Sobiesierski, P. M Smowton, P Blood, Vincent Teng, Rowan Brown

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Volume: 22, Issue: 4, Start page: 2014

Swansea University Authors: Vincent Teng, Rowan Brown

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DOI (Published version): 10.1116/1.1768187

Published in: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
ISSN: 0734-211X
Published: 2004
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URI: https://cronfa.swan.ac.uk/Record/cronfa12724
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College: College of Engineering
Issue: 4
Start Page: 2014