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Impurity-induced disordering in AlGaInP superlattices studied using cross-sectional scanning tunneling microscopy

K. S Teng, M. R Brown, S. P Wilks, A Sobiesierski, P. M Smowton, P Blood, Vincent Teng Orcid Logo, Rowan Brown Orcid Logo

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Volume: 22, Issue: 4, Start page: 2014

Swansea University Authors: Vincent Teng Orcid Logo, Rowan Brown Orcid Logo

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DOI (Published version): 10.1116/1.1768187

Published in: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
ISSN: 0734-211X
Published: 2004
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URI: https://cronfa.swan.ac.uk/Record/cronfa12724
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first_indexed 2013-07-23T12:08:38Z
last_indexed 2018-02-09T04:42:56Z
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spelling 2011-10-01T00:00:00.0000000 v2 12724 2012-09-18 Impurity-induced disordering in AlGaInP superlattices studied using cross-sectional scanning tunneling microscopy 98f529f56798da1ba3e6e93d2817c114 0000-0003-4325-8573 Vincent Teng Vincent Teng true false d7db8d42c476dfa69c15ce06d29bd863 0000-0003-3628-2524 Rowan Brown Rowan Brown true false 2012-09-18 EEEG Journal Article Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 22 4 2014 0734-211X 31 12 2004 2004-12-31 10.1116/1.1768187 COLLEGE NANME Electronic and Electrical Engineering COLLEGE CODE EEEG Swansea University 2011-10-01T00:00:00.0000000 2012-09-18T13:00:19.3250179 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering K. S Teng 1 M. R Brown 2 S. P Wilks 3 A Sobiesierski 4 P. M Smowton 5 P Blood 6 Vincent Teng 0000-0003-4325-8573 7 Rowan Brown 0000-0003-3628-2524 8
title Impurity-induced disordering in AlGaInP superlattices studied using cross-sectional scanning tunneling microscopy
spellingShingle Impurity-induced disordering in AlGaInP superlattices studied using cross-sectional scanning tunneling microscopy
Vincent Teng
Rowan Brown
title_short Impurity-induced disordering in AlGaInP superlattices studied using cross-sectional scanning tunneling microscopy
title_full Impurity-induced disordering in AlGaInP superlattices studied using cross-sectional scanning tunneling microscopy
title_fullStr Impurity-induced disordering in AlGaInP superlattices studied using cross-sectional scanning tunneling microscopy
title_full_unstemmed Impurity-induced disordering in AlGaInP superlattices studied using cross-sectional scanning tunneling microscopy
title_sort Impurity-induced disordering in AlGaInP superlattices studied using cross-sectional scanning tunneling microscopy
author_id_str_mv 98f529f56798da1ba3e6e93d2817c114
d7db8d42c476dfa69c15ce06d29bd863
author_id_fullname_str_mv 98f529f56798da1ba3e6e93d2817c114_***_Vincent Teng
d7db8d42c476dfa69c15ce06d29bd863_***_Rowan Brown
author Vincent Teng
Rowan Brown
author2 K. S Teng
M. R Brown
S. P Wilks
A Sobiesierski
P. M Smowton
P Blood
Vincent Teng
Rowan Brown
format Journal article
container_title Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
container_volume 22
container_issue 4
container_start_page 2014
publishDate 2004
institution Swansea University
issn 0734-211X
doi_str_mv 10.1116/1.1768187
college_str Faculty of Science and Engineering
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hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering
document_store_str 0
active_str 0
published_date 2004-12-31T03:14:37Z
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score 11.016235

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