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A review of recent advances in surface defect detection using texture analysis techniques

X Xie, Xianghua Xie Orcid Logo

Electronic Letters on Computer Vision and Image Analysis, Volume: 7, Issue: 3, Pages: 1 - 25

Swansea University Author: Xianghua Xie Orcid Logo

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DOI (Published version): 10.5565/rev/elcvia.268

Published in: Electronic Letters on Computer Vision and Image Analysis
Published: 2008
Online Access: http://elcvia.cvc.uab.es/article/view/268
URI: https://cronfa.swan.ac.uk/Record/cronfa131
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College: Faculty of Science and Engineering
Issue: 3
Start Page: 1
End Page: 25