Conference Paper/Proceeding/Abstract 1164 views 182 downloads
Localising Surface Defects in Random Colour Textures using Multiscale Texem Analysis in Image Eigenchannels
IEEE International Conference on Image Processing, Volume: 3, Pages: 1124 - 1127
Swansea University Author: Xianghua Xie
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DOI (Published version): 10.1109/ICIP.2005.1530594
Abstract
Localising Surface Defects in Random Colour Textures using Multiscale Texem Analysis in Image Eigenchannels
Published in: | IEEE International Conference on Image Processing |
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ISBN: | 0-7803-9134-9 |
ISSN: | 1522-4880 2381-8549 |
Published: |
Genova, Italy
IEEE International Conference on Image Processing
2005
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Online Access: |
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URI: | https://cronfa.swan.ac.uk/Record/cronfa18022 |
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College: |
Faculty of Science and Engineering |
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Start Page: |
1124 |
End Page: |
1127 |