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Conference Paper/Proceeding/Abstract 628 views 104 downloads

Localising Surface Defects in Random Colour Textures using Multiscale Texem Analysis in Image Eigenchannels

Xianghua Xie Orcid Logo, Majid Mirmehdi

IEEE International Conference on Image Processing, Volume: 3, Pages: 1124 - 1127

Swansea University Author: Xianghua Xie Orcid Logo

Published in: IEEE International Conference on Image Processing
ISBN: 0-7803-9134-9
ISSN: 1522-4880 2381-8549
Published: Genova, Italy IEEE International Conference on Image Processing 2005
Online Access: Check full text

URI: https://cronfa.swan.ac.uk/Record/cronfa18022
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College: College of Science
Start Page: 1124
End Page: 1127