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Localising Surface Defects in Random Colour Textures using Multiscale Texem Analysis in Image Eigenchannels / Xianghua Xie; Majid Mirmehdi

IEEE International Conference on Image Processing, Volume: 3, Pages: 1124 - 1127

Swansea University Author: Xianghua, Xie

Published in: IEEE International Conference on Image Processing
ISBN: 0-7803-9134-9
ISSN: 1522-4880 2381-8549
Published: Genova, Italy IEEE International Conference on Image Processing 2005
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URI: https://cronfa.swan.ac.uk/Record/cronfa18022
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last_indexed 2019-06-14T19:26:24Z
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spelling 2019-06-14T16:30:01.2415194 v2 18022 2014-05-29 Localising Surface Defects in Random Colour Textures using Multiscale Texem Analysis in Image Eigenchannels b334d40963c7a2f435f06d2c26c74e11 0000-0002-2701-8660 Xianghua Xie Xianghua Xie true false 2014-05-29 SCS Conference Paper/Proceeding/Abstract IEEE International Conference on Image Processing 3 1124 1127 IEEE International Conference on Image Processing Genova, Italy 0-7803-9134-9 1522-4880 2381-8549 30 9 2005 2005-09-30 10.1109/ICIP.2005.1530594 COLLEGE NANME Computer Science COLLEGE CODE SCS Swansea University 2019-06-14T16:30:01.2415194 2014-05-29T18:45:55.7947032 College of Science Computer Science Xianghua Xie 0000-0002-2701-8660 1 Majid Mirmehdi 2 0018022-20042015163534.pdf texem-icip.pdf 2015-04-20T16:35:34.5370000 Output 299593 application/pdf Version of Record true 2015-04-20T00:00:00.0000000 true
title Localising Surface Defects in Random Colour Textures using Multiscale Texem Analysis in Image Eigenchannels
spellingShingle Localising Surface Defects in Random Colour Textures using Multiscale Texem Analysis in Image Eigenchannels
Xianghua, Xie
title_short Localising Surface Defects in Random Colour Textures using Multiscale Texem Analysis in Image Eigenchannels
title_full Localising Surface Defects in Random Colour Textures using Multiscale Texem Analysis in Image Eigenchannels
title_fullStr Localising Surface Defects in Random Colour Textures using Multiscale Texem Analysis in Image Eigenchannels
title_full_unstemmed Localising Surface Defects in Random Colour Textures using Multiscale Texem Analysis in Image Eigenchannels
title_sort Localising Surface Defects in Random Colour Textures using Multiscale Texem Analysis in Image Eigenchannels
author_id_str_mv b334d40963c7a2f435f06d2c26c74e11
author_id_fullname_str_mv b334d40963c7a2f435f06d2c26c74e11_***_Xianghua, Xie
author Xianghua, Xie
author2 Xianghua Xie
Majid Mirmehdi
format Conference Paper/Proceeding/Abstract
container_title IEEE International Conference on Image Processing
container_volume 3
container_start_page 1124
publishDate 2005
institution Swansea University
isbn 0-7803-9134-9
issn 1522-4880
2381-8549
doi_str_mv 10.1109/ICIP.2005.1530594
publisher IEEE International Conference on Image Processing
college_str College of Science
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hierarchy_top_id collegeofscience
hierarchy_top_title College of Science
hierarchy_parent_id collegeofscience
hierarchy_parent_title College of Science
department_str Computer Science{{{_:::_}}}College of Science{{{_:::_}}}Computer Science
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published_date 2005-09-30T03:32:05Z
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