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Conference Paper/Proceeding/Abstract 895 views 547 downloads

Texture Exemplars for Defect Detection on Random Textures

Xianghua Xie Orcid Logo, Majid Mirmehdi

International Conference on Advances in Pattern Recognition, Pages: 404 - 413

Swansea University Author: Xianghua Xie Orcid Logo

DOI (Published version): 10.1007/11552499_46

Published in: International Conference on Advances in Pattern Recognition
ISBN: 978-3-540-28833-6 978-3-540-31999-3
Published: Springer 2005
URI: https://cronfa.swan.ac.uk/Record/cronfa18021
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College: Faculty of Science and Engineering
Start Page: 404
End Page: 413