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Texture Exemplars for Defect Detection on Random Textures / Xianghua Xie; Majid Mirmehdi

International Conference on Advances in Pattern Recognition, Pages: 404 - 413

Swansea University Author: Xie, Xianghua

DOI (Published version): 10.1007/11552499_46

Published in: International Conference on Advances in Pattern Recognition
Published: Springer 2005
URI: https://cronfa.swan.ac.uk/Record/cronfa18021
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College: College of Science
Start Page: 404
End Page: 413