Conference Paper/Proceeding/Abstract 1043 views 586 downloads
Texture Exemplars for Defect Detection on Random Textures
International Conference on Advances in Pattern Recognition, Pages: 404 - 413
Swansea University Author: Xianghua Xie
-
PDF | Version of Record
Download (2.13MB)
DOI (Published version): 10.1007/11552499_46
Abstract
Texture Exemplars for Defect Detection on Random Textures
Published in: | International Conference on Advances in Pattern Recognition |
---|---|
ISBN: | 978-3-540-28833-6 978-3-540-31999-3 |
Published: |
Springer
2005
|
URI: | https://cronfa.swan.ac.uk/Record/cronfa18021 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
first_indexed |
2015-04-21T02:00:54Z |
---|---|
last_indexed |
2019-06-14T19:26:24Z |
id |
cronfa18021 |
recordtype |
SURis |
fullrecord |
<?xml version="1.0"?><rfc1807><datestamp>2019-06-14T16:28:28.4637643</datestamp><bib-version>v2</bib-version><id>18021</id><entry>2014-05-29</entry><title>Texture Exemplars for Defect Detection on Random Textures</title><swanseaauthors><author><sid>b334d40963c7a2f435f06d2c26c74e11</sid><ORCID>0000-0002-2701-8660</ORCID><firstname>Xianghua</firstname><surname>Xie</surname><name>Xianghua Xie</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2014-05-29</date><deptcode>SCS</deptcode><abstract></abstract><type>Conference Paper/Proceeding/Abstract</type><journal>International Conference on Advances in Pattern Recognition</journal><paginationStart>404</paginationStart><paginationEnd>413</paginationEnd><publisher>Springer</publisher><isbnPrint>978-3-540-28833-6</isbnPrint><isbnElectronic>978-3-540-31999-3</isbnElectronic><keywords/><publishedDay>31</publishedDay><publishedMonth>8</publishedMonth><publishedYear>2005</publishedYear><publishedDate>2005-08-31</publishedDate><doi>10.1007/11552499_46</doi><url/><notes></notes><college>COLLEGE NANME</college><department>Computer Science</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>SCS</DepartmentCode><institution>Swansea University</institution><apcterm/><lastEdited>2019-06-14T16:28:28.4637643</lastEdited><Created>2014-05-29T18:44:20.7558976</Created><path><level id="1">Faculty of Science and Engineering</level><level id="2">School of Mathematics and Computer Science - Computer Science</level></path><authors><author><firstname>Xianghua</firstname><surname>Xie</surname><orcid>0000-0002-2701-8660</orcid><order>1</order></author><author><firstname>Majid</firstname><surname>Mirmehdi</surname><order>2</order></author></authors><documents><document><filename>0018021-20042015163604.pdf</filename><originalFilename>icapr2005.pdf</originalFilename><uploaded>2015-04-20T16:36:04.8470000</uploaded><type>Output</type><contentLength>2230115</contentLength><contentType>application/pdf</contentType><version>Version of Record</version><cronfaStatus>true</cronfaStatus><embargoDate>2015-04-20T00:00:00.0000000</embargoDate><documentNotes/><copyrightCorrect>true</copyrightCorrect></document></documents><OutputDurs/></rfc1807> |
spelling |
2019-06-14T16:28:28.4637643 v2 18021 2014-05-29 Texture Exemplars for Defect Detection on Random Textures b334d40963c7a2f435f06d2c26c74e11 0000-0002-2701-8660 Xianghua Xie Xianghua Xie true false 2014-05-29 SCS Conference Paper/Proceeding/Abstract International Conference on Advances in Pattern Recognition 404 413 Springer 978-3-540-28833-6 978-3-540-31999-3 31 8 2005 2005-08-31 10.1007/11552499_46 COLLEGE NANME Computer Science COLLEGE CODE SCS Swansea University 2019-06-14T16:28:28.4637643 2014-05-29T18:44:20.7558976 Faculty of Science and Engineering School of Mathematics and Computer Science - Computer Science Xianghua Xie 0000-0002-2701-8660 1 Majid Mirmehdi 2 0018021-20042015163604.pdf icapr2005.pdf 2015-04-20T16:36:04.8470000 Output 2230115 application/pdf Version of Record true 2015-04-20T00:00:00.0000000 true |
title |
Texture Exemplars for Defect Detection on Random Textures |
spellingShingle |
Texture Exemplars for Defect Detection on Random Textures Xianghua Xie |
title_short |
Texture Exemplars for Defect Detection on Random Textures |
title_full |
Texture Exemplars for Defect Detection on Random Textures |
title_fullStr |
Texture Exemplars for Defect Detection on Random Textures |
title_full_unstemmed |
Texture Exemplars for Defect Detection on Random Textures |
title_sort |
Texture Exemplars for Defect Detection on Random Textures |
author_id_str_mv |
b334d40963c7a2f435f06d2c26c74e11 |
author_id_fullname_str_mv |
b334d40963c7a2f435f06d2c26c74e11_***_Xianghua Xie |
author |
Xianghua Xie |
author2 |
Xianghua Xie Majid Mirmehdi |
format |
Conference Paper/Proceeding/Abstract |
container_title |
International Conference on Advances in Pattern Recognition |
container_start_page |
404 |
publishDate |
2005 |
institution |
Swansea University |
isbn |
978-3-540-28833-6 978-3-540-31999-3 |
doi_str_mv |
10.1007/11552499_46 |
publisher |
Springer |
college_str |
Faculty of Science and Engineering |
hierarchytype |
|
hierarchy_top_id |
facultyofscienceandengineering |
hierarchy_top_title |
Faculty of Science and Engineering |
hierarchy_parent_id |
facultyofscienceandengineering |
hierarchy_parent_title |
Faculty of Science and Engineering |
department_str |
School of Mathematics and Computer Science - Computer Science{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Mathematics and Computer Science - Computer Science |
document_store_str |
1 |
active_str |
0 |
published_date |
2005-08-31T03:21:01Z |
_version_ |
1763750614286729216 |
score |
11.035634 |