No Cover Image

Conference Paper/Proceeding/Abstract 393 views 384 downloads

Texture Exemplars for Defect Detection on Random Textures / Xianghua, Xie

International Conference on Advances in Pattern Recognition, Pages: 404 - 413

Swansea University Author: Xianghua, Xie

DOI (Published version): 10.1007/11552499_46

Published in: International Conference on Advances in Pattern Recognition
ISBN: 978-3-540-28833-6 978-3-540-31999-3
Published: Springer 2005
URI: https://cronfa.swan.ac.uk/Record/cronfa18021
Tags: Add Tag
No Tags, Be the first to tag this record!
first_indexed 2015-04-21T02:00:54Z
last_indexed 2019-06-14T19:26:24Z
id cronfa18021
recordtype SURis
fullrecord <?xml version="1.0"?><rfc1807><datestamp>2019-06-14T16:28:28.4637643</datestamp><bib-version>v2</bib-version><id>18021</id><entry>2014-05-29</entry><title>Texture Exemplars for Defect Detection on Random Textures</title><swanseaauthors><author><sid>b334d40963c7a2f435f06d2c26c74e11</sid><ORCID>0000-0002-2701-8660</ORCID><firstname>Xianghua</firstname><surname>Xie</surname><name>Xianghua Xie</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2014-05-29</date><deptcode>SCS</deptcode><abstract></abstract><type>Conference Paper/Proceeding/Abstract</type><journal>International Conference on Advances in Pattern Recognition</journal><paginationStart>404</paginationStart><paginationEnd>413</paginationEnd><publisher>Springer</publisher><isbnPrint>978-3-540-28833-6</isbnPrint><isbnElectronic>978-3-540-31999-3</isbnElectronic><keywords/><publishedDay>31</publishedDay><publishedMonth>8</publishedMonth><publishedYear>2005</publishedYear><publishedDate>2005-08-31</publishedDate><doi>10.1007/11552499_46</doi><url/><notes></notes><college>COLLEGE NANME</college><department>Computer Science</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>SCS</DepartmentCode><institution>Swansea University</institution><lastEdited>2019-06-14T16:28:28.4637643</lastEdited><Created>2014-05-29T18:44:20.7558976</Created><path><level id="1">College of Science</level><level id="2">Computer Science</level></path><authors><author><firstname>Xianghua</firstname><surname>Xie</surname><orcid>0000-0002-2701-8660</orcid><order>1</order></author><author><firstname>Majid</firstname><surname>Mirmehdi</surname><order>2</order></author></authors><documents><document><filename>0018021-20042015163604.pdf</filename><originalFilename>icapr2005.pdf</originalFilename><uploaded>2015-04-20T16:36:04.8470000</uploaded><type>Output</type><contentLength>2230115</contentLength><contentType>application/pdf</contentType><version>Version of Record</version><cronfaStatus>true</cronfaStatus><action/><embargoDate>2015-04-20T00:00:00.0000000</embargoDate><documentNotes/><copyrightCorrect>true</copyrightCorrect></document></documents></rfc1807>
spelling 2019-06-14T16:28:28.4637643 v2 18021 2014-05-29 Texture Exemplars for Defect Detection on Random Textures b334d40963c7a2f435f06d2c26c74e11 0000-0002-2701-8660 Xianghua Xie Xianghua Xie true false 2014-05-29 SCS Conference Paper/Proceeding/Abstract International Conference on Advances in Pattern Recognition 404 413 Springer 978-3-540-28833-6 978-3-540-31999-3 31 8 2005 2005-08-31 10.1007/11552499_46 COLLEGE NANME Computer Science COLLEGE CODE SCS Swansea University 2019-06-14T16:28:28.4637643 2014-05-29T18:44:20.7558976 College of Science Computer Science Xianghua Xie 0000-0002-2701-8660 1 Majid Mirmehdi 2 0018021-20042015163604.pdf icapr2005.pdf 2015-04-20T16:36:04.8470000 Output 2230115 application/pdf Version of Record true 2015-04-20T00:00:00.0000000 true
title Texture Exemplars for Defect Detection on Random Textures
spellingShingle Texture Exemplars for Defect Detection on Random Textures
Xianghua, Xie
title_short Texture Exemplars for Defect Detection on Random Textures
title_full Texture Exemplars for Defect Detection on Random Textures
title_fullStr Texture Exemplars for Defect Detection on Random Textures
title_full_unstemmed Texture Exemplars for Defect Detection on Random Textures
title_sort Texture Exemplars for Defect Detection on Random Textures
author_id_str_mv b334d40963c7a2f435f06d2c26c74e11
author_id_fullname_str_mv b334d40963c7a2f435f06d2c26c74e11_***_Xianghua, Xie
author Xianghua, Xie
format Conference Paper/Proceeding/Abstract
container_title International Conference on Advances in Pattern Recognition
container_start_page 404
publishDate 2005
institution Swansea University
isbn 978-3-540-28833-6
978-3-540-31999-3
doi_str_mv 10.1007/11552499_46
publisher Springer
college_str College of Science
hierarchytype
hierarchy_top_id collegeofscience
hierarchy_top_title College of Science
hierarchy_parent_id collegeofscience
hierarchy_parent_title College of Science
department_str Computer Science{{{_:::_}}}College of Science{{{_:::_}}}Computer Science
document_store_str 1
active_str 0
published_date 2005-08-31T19:27:44Z
_version_ 1667778650706018304
score 10.900407